摘要
基于从时间应力导致组件损伤的机理,对组件损伤演变过程和模型进行了研究。以系统的多组件动态损伤为信息源,通过建立多组件损伤与系统故障演化的隐马尔可夫模型,对系统故障预测的详细技术流程和相关算法进行了研究。最后以某开关电路系统为研究对象,对提出的系统故障预测技术的有效性进行了实验验证和分析。
A fault prognosis method for system based on dynamic damages of multi-components induced by time stress is studied. A damage evolution model for the component of electronic system is put forward by analyzing the damage accumulation mechanism. The fault prognosis model for electronic system is researched based on the hidden Markov model （HMM） of multi-components, and the process and algorithm of the method are introduced in detail. Finally, the validity of the fault prognosis method is proved by an experimental study of the switching circuit system.
出处
《系统工程与电子技术》
EI
CSCD
北大核心
2008年第10期2014-2018,共5页
Systems Engineering and Electronics
