摘要
本文报道了用光声光谱计算机位相分离法测定叶片的内层叶绿体光声光谱和淀积在陶瓷衬底上的Ba-Y-Cu-O超导体薄膜的光声光谱。本方法能排除衬底或表层吸收的干扰。本文并对测定薄膜厚度及致密程度的方法进行了讨论。
Analyses of interior PA spectrum of plant leaf and surface PA spectrum of Ba-Y-Cu-O thin film coated on the ceramic slice by computerized phase separated PAS spectra were reported. The phase separated PAS spectra of interior or surface layer can not be affected by light absorption of another layer. The methods for measurement of the thin film thickness and evaluation of the film quality were also discussed.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1989年第9期788-790,共3页
Chinese Journal of Analytical Chemistry
关键词
双层结构样品
光声光谱
相分离法
Photcacoustic spectrum
Two-layer sample
Phase separated spectrum
Plant leaf
supereonductor film
