摘要
The large-scale ZnO rods of submicrometer were prepared on the bare glass using a wet chemical method under different experimental parameters,such as the reactant concentration and the growth time.The microstructure of the ZnO rods was characterized by X-ray diffractometry(XRD) and field emission scanning electron microscopy (FESEM) with the energy dispersive X-ray spectroscopy(EDX),and the optical property was investigated by the room-temperature photoluminescence (PL) spectra.XRD and FESEM results show that the wurtzite structure and rod-like ZnO is obtained.The length (3-8 μm) and the diameter (400 nm-3 μm) vary with the experimental parameters.A strong UV emission at 384 nm and a weak visible yellow-green emission around 570 nm are observed in the PL spectrum.After annealing at 600 ℃ in air,the UV peak intensity increases obviously and the yellow-green peak intensity decreases greatly.The near-band-edge UV emission is attributed to the exciton recombination; the yellow-green emission can be associated with the defect recombination; and some defect complexes may be responsible for the latter emission.
The large-scale ZnO rods of submicrometer were prepared on the bare glass using a wet chemical method under different experimental parameters, such as the reactant concentration and the growth time. The microstructure of the ZnO rods was characterized by X-ray diffractometry（XRD） and field emission scanning electron microscopy （FESEM） with the energy dispersive X-ray spectroscopy（EDX）, and the optical property was investigated by the room-temperature photoluminescence （PL） spectra. XRD and FESEM results show that the wurtzite structure and rod-like ZnO is obtained. The length （3-8 μm） and the diameter （400 nm- 3 μm） vary with the experimental parameters. A strong UV emission at 384 nm and a weak visible yellow-green emission around 570 nm are observed in the PL spectrum. After annealing at 600 ℃ in air, the UV peak intensity increases obviously and the yellow-green peak intensity decreases greatly. The near-band-edge UV emission is attributed to the exciton recombination; the yellow-green emission can be associated with the defect recombination; and some defect complexes may be responsible for the latter emission.
出处
《中国有色金属学会会刊：英文版》
EI
CSCD
2008年第5期1089-1093,共5页
Transactions of Nonferrous Metals Society of China
基金
Project(2004CB619301) supported by the National Basic Research Program of China
Project supported by 985-Automotive Engineering of Jilin University, China
