摘要
本文提出了一种适合对光敏元的响应特性为非线性的红外焦平面阵列进行不均匀性校正的改进算法，与现有的算法相比，该法具有便于用软件和硬件实现的优点。同时，通过对改进前后的算法进行理论分析和软件模拟结果比较，证明二者的校正精度无本质差别，校正效果基本相同。
An improved nonuniformity correction algorithm is presented which is suitable for the infrared focal plane arrays with a nonlinearity of the photoresponse characteristic.Comparing with old algorithm, it is easier to achieve by software or hardware. At the same time, it is shown that the correction precision and the correction effect of the new algorithm are substantially the same as that of the old one through theretical analysis and comparisons of the simulation results.
