摘要
随着科学技术的高速发展,越来越多的领域提出了对物体三维尺寸进行测量的要求。本文首先系统地阐述了光栅投影三维形貌测量方法的基本原理、主要优缺点及应用范围,随后对其发展方向和研究热点进行了探讨。
With the rapid development of science and technology, more and more fields have brought forward re- quirements for measuring three-dimensional of objects. This paper firstly expounds the basic principle, advantages, limitations, and application areas of three-dimensional measuring methods with grating projection systematically. Subsequently, the current research focus and some ideas about perspective trend are discussed.
出处
《光机电信息》
2008年第9期31-36,共6页
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