摘要
通过电子背散射衍射(EBSD)技术和取向成像显微(OIM)技术对经过不同工艺处理的含硅3%硅钢样品织构和晶界特征分布(GBCD)进行研究。结果表明:在所有样品中,Σ1晶界在低ΣCSL晶界中所占比例最高,立方取向晶粒之间构成Σ1晶界;Σ13b和Σ29a随着立方取向晶粒增多而增多,尤其是Σ13b更为明显;对于各取向晶粒相当的试样,Σ1晶界最多,Σ3、Σ5、Σ7、Σ9、Σ11、Σ15晶界比例接近。
The character distributions of grain boundary in 3% Si steel sheet treated with different processes were studied by electron back scatting diffraction （EBSD） and orientation imaging microscopy. The results showed that the ∑1 boundaries were composed among the cubic orientation grains, which had the largest proportion in all the low CSL boundaries existed in the samples, the ∑13b and∑29a boundaries were enhanced with the increasing of cubic orientation grains, especially to the ∑13b. For the samples with eqnivalent orientation grains, the ∑1 was of max boundary, the ratio of grain boundaries was equal for the ∑3, ∑5, ∑7,∑9,∑11 and ∑15 boundaries.
出处
《上海金属》
CAS
2008年第5期20-23,共4页
Shanghai Metals
基金
国家自然科学基金资助项目(50571058)
关键词
硅钢
退火
晶界特征分布
立方织构
Silicon Steel, Annealing, Grain Boundary Character Distribution, Cubic Texture
