摘要
采用透射电子显微术（ＴＥＭ），研究了用磁控溅射技术在柔性金属基体上制备的、钇稳定的ＺｒＯ２（ＹＳＺ）为过镀层的ＹＢａ２Ｃｕ３Ｏ７－ｙ（ＹＢＣＯ）薄膜的横断面结构。所得ＹＢＣＯ膜的超导临界转变温度Ｔｃ为９１Ｋ，临界电流密度Ｊｃ＝２×１０３Ａ／ｃｍ２（７７Ｋ，０Ｔ）。基体为Ｎｉ基合金（ＨａｓｔｅｌｏｙＣ）。ＹＳＺ层为致密、均匀的细晶组织，约１２μｍ厚，具有织构取向，并与基体紧密连接。ＹＢＣＯ层的厚度不均匀，约５００ｎｍ；ＹＢＣＯ／ＹＳＺ界面有时连接较差，在该界面上有杂质出现，杂质有可能引发裂纹。
icrostructures of YBa2Cu3O7-y(YBCO) film on flexible metal substrate with yttriastabilized zirconia(YSZ) buffer layer prepared by magnetron sputtering technique have been studied in this paper using transmission electron microscopy(TEM). A critical temperature (Tc) and a critical current density(Jc) of the YBCO film are 91 K and 2×103 A/cm2 at 77 K, 0 T respectively. Bonded steadfastly to the substrate of nickel alloy (HastelloyC), the dense, even and textured YSZ layer with fine crystal grains is about 12 μm thick. With an uneven thickness of about 500 nm, the YBCO layer is sometimes weakbonded to the YSZ layer. Impurities, which occasionally lead to cracks, were observed at the YSZ/YBCO interface.
出处
《中国稀土学报》
CAS
CSCD
北大核心
1997年第4期367-370,379,共5页
Journal of the Chinese Society of Rare Earths
基金
国家自然科学基金
关键词
钇
YBCO薄膜
YSZ过渡层
微结构
超导体
Rare earths, Yttrium, YBCO film, YSZ buffer layer, Microstructure, Metal substrate
