摘要
为了研究塞曼效应的谱线分裂情况,用量子理论和CCD图像相结合的方法分析了Hg(546.1 nm)谱线在外磁场中的分裂.根据强度分析获得的峰值坐标计算得到电子核质比为1.762×1011C/kg,与公认值的相对误差仅为0.2%,表明用高分辨率CCD观察拍摄塞曼效应的分裂谱线比传统方法更直观方便.进一步结合图像的强度分析,不仅能更好的描述塞曼分裂谱线的细节,而且能获得较为精确的电子荷质比值.
In order to study the spilt spectrum of Zeeman effect experiment,the method for the spilt spectrum line of Hg（546. 1 nm） in magnetic field is analyzed based on quantum theory analysis and CCD image disposal. The results show that the charge-mass ratio of electron is 1. 762 × 10^11C/kg based on the intensity of the peak value, and the relative error with recognition value only is less than 0. 2%. CCD image technology is more intuitional and convenient. The image fawther analysis indicates that CCD image techineogy describes not only the detail of Zeeman spilt spectrum, but also obtains the precision value of the charge-mass ratio of electron.
出处
《西安工业大学学报》
CAS
2008年第3期205-207,共3页
Journal of Xi’an Technological University
关键词
塞曼效应
磁场
CCD图像
强度分析
zeeman effect
magnetic field
CCD image
intensity analysis
