摘要
本文介绍一种能用于球形或近似球形微粒的X射线显微定量分析方法。对多元素钴基合金、黄铁矿等微粒样品进行了实际分析,获得了比较好的结果。
An analytical method and correction program are described to yield an estimate of concentration in the mulielement powdered specimen using wavelength-dispersive spectrometer (WDS) in the electron-probe X-ray microanalysis. The results of the cobalt alloy containing 5 elements and other microparticles have been obtained and their relative errors compared with those of chemical analysis do not exceed 10％. The experience how to correct the X-ray intensity ratio (K value) for powdered specimen has also been discussed.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1989年第1期74-76,共3页
Chinese Journal of Analytical Chemistry
关键词
X线
显微法
粉末样品
X-ray microanalysis
Powdered specimen
correction program
