期刊文献+

MCP输入电子能量与微光像增强器信噪比的关系 被引量:9

Optimization for signal-to-noise ratio of low-light-level image intensifier
在线阅读 下载PDF
导出
摘要 为了提高MCP像增强器亮度增益,在微光像增强器中采用了新的电子倍增机构,即微通道板(MCP),并对作为电子倍增结构MCP的噪声产生机理进行分析。在MCP其他参数不变的条件下,通过调整MCP入射电子的能量和入射电子角度分布,优化了MCP最佳工作信噪比的工作条件,实现了优化MCP像增强器信噪比,提高了MCP像增强器的亮度增益。 In order to improve the luminance gain of microchannel plate image intensifier, an electron multiplier mechanism-microchannel plate (MCP) was used in low light level image intensifier. The noise mechanism in the MCP was analyzed. By adjusting the energy and angle distribution of the incident electrons at MCP and keeping other MCP parameters unchanged, the optimum operation conditions of MCP for best signal-to-noise ratio were found. The best signal- to-noise ratio of the MCP image intensifier was achieved and the brightness gain of MCP image intensifier was improved.
出处 《应用光学》 CAS CSCD 2008年第4期562-564,共3页 Journal of Applied Optics
关键词 微通道板 像增强器 信噪比 microchannel plate (MCP) image intensifier tube signal-to-noise ratio
  • 相关文献

参考文献3

二级参考文献11

  • 1潘京生,苏德坦,刘术林,邓广绪.一种玻璃成分优化的微通道板[J].应用光学,2007,28(1):16-19. 被引量:6
  • 2周立伟.微光成像技术的进展与展望[C].母国光.现代光学与光子学进展-庆祝王大珩院士从事科学活动65周年专集.天津:天津科学技术出版社,2003,316-339.
  • 3LOKTIONOV V.High technology of night vision system with image intensifiers manufacture[J].SPIE,2005,5834:197-202.
  • 4Delft Electronic Products B V.The Delft Electronic Products Guide to:Image Intensifiers,Digitised Image Intensifiers,Intensified CCD's,Photon Counters[EB/OL] Dwazziewegen,Netherlands.Delft Instruments Company,2004-09-21/[2004-10-11] http://www/dep.nl.
  • 5FLORYAN R,DEVOE N,PECK T.New image in-tensifier family for military and homeland defense[J].SPIE,2003,5071:397-404.
  • 6ESTRERA J P,OSTROMEK T,BACARELLA A,et al,Advanced image intensifier night vision system technology:satatus and summary 2002[J].SPIE,2003,4796:49-60.
  • 7LAPRADE B N,REINHART S T,WHEELER M.A low noise figure microchannel plate optimized for Gen.Ⅲ image intensification systems[J].SPIE,1990,1243:162-172.
  • 8SINOR T W,ESTERA J P.An analysis of electron scattering in thin dielectric films used as ion barriers in generation Ⅲ image tube[J].SPIE,2003,4796:23-32.
  • 9OLAF Koschülzke.The Generation Gap:Gen Ⅱvs Gen Ⅲvs Ultravis[EB/OL].Darmstadt Germany,LOT-Oriel Group Europe,2005/[2006-12-28].http://www.lot-oriel.com/site/site_down/cc_istagapr_deen.pdf.
  • 10THEN A,PANTANO C.Formation and behavior of surface layers on electron emission glasses[J].J.Non-Crystalline Solids,1990,120:178-187.

共引文献12

同被引文献64

引证文献9

二级引证文献27

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部