摘要
用统计理论分析了光子图象中信号和噪声的分布，提出了用Ｘ２准则拟合信号和背景的强度及分布区域，并将统计区域中计数是背景的概率大于是信号的概率的计数去除。针对光子图象处理的特点，首次提出了一种评价光子图象处理效果的标准，并用计算机模拟生成大量光子图象并进行处理，获得了三个影响因素（图象划分、信噪比、总计数）和图象处理效果的量化关系。计算机模拟生成和处理光子图象的方法，以及得到的关系对于研究光子图象有一定的价值。
In order to measure the surface deformation and strain field of a material in high accuracy,one is working for perfecting the orthogonal network technique etching 1,000￣10,000 lines/mm on sample surface.This is a new technique with larger difficulty.The line with larger width is out of use for its poor operating effects.The difficulty in making high density lines on the sample surface is avoided.The new method for etching surface grating with 10￣100 lines/mm is used on the sample surface.The gap d and its variable Δ d will be measured,converted and enlarged into diffractio speckle distance L and its variable Δ L ,then the measurement can be carried out.The millimeter magnitude measuremetn of the deformation will be raised to the measuring accuracy of micrometer magnitude..Thus a new approach for processing and obtaining surface deformation and strain field with high accuracy(micrometer magnitude),fast speed (microsecond) has been opened.
出处
《光电工程》
CAS
CSCD
1997年第3期26-32,共7页
Opto-Electronic Engineering
基金
国家自然科学基金
关键词
光子
图象处理
光子统计
计算机模拟
Deformation measurement,Strain measurement,Material defect,Surface defect,Photoelectric measurement.
