摘要
介绍了二次离子质谱(SIMS)的结构、基本原理、分析特点,特别是飞行时间二次离子质谱在摩擦学研究领域,如对涂层及摩擦反应膜、润滑油添加剂的吸附与反应、硬磁盘/磁头摩擦界面中的应用与进展,指出了飞行时间二次离子质谱分析中存在的问题,希望为摩擦学领域学者在表面分析方面提供一些新的启示.
Secondary ion mass spectroscopy （SIMS） features the unique qualities of mass spectrometry, such as ppm-ppb sensitivity, isotope distinction, and detection of even involatile organic molecular species. It is a powerful surface analysis method in all fields where extreme surface sensitivity and molecular surface information are required. Structure, fundamental principle and analysis characteristics of SIMS were outlined. Application of time-offlight secondary ion mass spectroscopy （TOF-SIMS） in the tribology fields such as in coatings, tribofilms, adsorption and reaction of lubricating oil additives and head-disk interface, etc. were reviewed. Problem in TOF-SIMS analysis was pointed out, and the manifold applications of TOF-SIMS in tribologcial studies was inspired.
出处
《摩擦学学报》
EI
CAS
CSCD
北大核心
2007年第6期592-599,共8页
Tribology
