摘要
利用红外显微镜分别对富Cd和富Te配料生长的两组碲锌镉晶片的沉积相进行观察,对观察结果做统计分析,发现两组晶片中的沉积相在形状和分布情况方面有很大差别,采用数据拟合的方法发现两组CdZnTe晶片中不同尺寸的沉积相颗粒的密度满足指数分布。
There are two groups of Cdo.96Zno.04Te wafers grown on Te-rich, Cd -rich respectively. The precipitates in wafers were observed by transmission infrared microscopy with quasi-confocal system. According to the observed result, there are significant different in shape of precipitate, but the distribution of precipitate density at different size are subject to a exponential decay distribution on two groups of wafers.
出处
《红外技术》
CSCD
北大核心
2007年第2期83-87,共5页
Infrared Technology
基金
云南省自然科学基金重点项目(2003E0012Z)
云南省科技创新人才计划(2005PY02-7)
