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Impact of organic contamination in vacuum on laser-induced damage threshold of TiO_2/SiO_2 dielectric mirrors 被引量:2

Impact of organic contamination in vacuum on laser-induced damage threshold of TiO_2/SiO_2 dielectric mirrors
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摘要 The influence of organic contamination in vacuum on the laser-induced damage threshold (LIDT) of coatings is studied. TiO2/SiO2 dielectric mirrors with high reflection at 1064 nm are deposited by the electronbeam evaporation method and their LIDTs are measured in vacuum and atmosphere, respectively. It is found that the contamination in vacuum is easily attracted to optical surfaces because of the low pressure and becomes the source of damage, O2 molecules in vacuum with contamination can accelerate the laser-induced damage by observing LIDT and damage morphologies. LIDTs of mirrors have a little change in vacuum compared with in atmosphere when the organic contamination is wiped off. The results indicate that organic contamination is a significant reason to decrease the LIDT in vacuum. The influence of organic contamination in vacuum on the laser-induced damage threshold (LIDT) of coatings is studied. TiO2/SiO2 dielectric mirrors with high reflection at 1064 nm are deposited by the electronbeam evaporation method and their LIDTs are measured in vacuum and atmosphere, respectively. It is found that the contamination in vacuum is easily attracted to optical surfaces because of the low pressure and becomes the source of damage, O2 molecules in vacuum with contamination can accelerate the laser-induced damage by observing LIDT and damage morphologies. LIDTs of mirrors have a little change in vacuum compared with in atmosphere when the organic contamination is wiped off. The results indicate that organic contamination is a significant reason to decrease the LIDT in vacuum.
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2007年第11期680-682,共3页 中国光学快报(英文版)
基金 This work was supported by the National Natural Science Foundation of China under Grant No.60708004.
关键词 CONTAMINATION Dielectric materials EVAPORATION Light reflection Mirrors SILICA Titanium dioxide Contamination Dielectric materials Evaporation Light reflection Mirrors Silica Titanium dioxide
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  • 1H.A.Abdeldayem,E.Dowdye,J.Canham,and T. Taeger. Proceedings of SPIE the International Society for Optical Engineering . 2005
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