摘要
微光枪瞄检测技术一直是军备生产者所关注的问题。由于振动、射击、冲击、跌落和高低温环境等载荷作用下,使微光枪瞄机械、光学结构和电性能参数发生改变,导致微光枪瞄不能正常工作和使用。为了解决上述问题,设计了多环境试验条件下的微光枪瞄检测与测试系统,给出了由CCD组成检测系统工作原理,利用直方图均衡化算法对微光枪瞄图像进行处理,并结合实际工程应用,其测量精度≤0.05 mil,测量范围≥40 mil,满足应用要求。
Low-level-light （LLL） weapon sight measurement technologies are always concerned by military equipment manufacturers. The load actions of vibration, shooting, shock, drop, high and low temperature environment, etc. make the machinery, the optical structure and the electric performance parameters of the sight to change with the result that the sight can＇t be worked and used normally at taking aim. In order to solve the problems above, the measure and test system of the sight was de- signed under environmental experiment condition, the operation principle of the detection system by CCD was given, the image of the sight was processed by the histogram equalization algorithm. The measure precision which is less than 0.05 mil and the measure range which is greater than 40 mil can meet the requirements of the engineering application.
出处
《兵工学报》
EI
CAS
CSCD
北大核心
2007年第10期1205-1208,共4页
Acta Armamentarii
基金
河南省教育厅自然科学研究项目(200511653001)
关键词
电子技术
直方图均衡化
微光枪瞄
检测
electron technology
histogram equalization
low-level-light weapon sight
measurement
