摘要
On the basis of the vector diffraction theory and Green＇s function method, this paper investigates the effects of refractive index mismatch on second-harmonic generation （SHG） microscopy. The polarization distribution and SHG intensity are calculated as functions of the sample radius and probe depth. The numerical results show that refractive index mismatch can result in peak intensity degradation, increase secondary lobes and extension of second- harmonic polarization distribution. Because of the attenuation of polarization intensity, the detected SHG intensity significantly decreases with increasing probe depth, which can limit the imaging depth of SHG microscopy inside thick samples. Forward SHG intensity decays slowly than backward SHG, due to the combination of extension second-harmonic polarization distribution and strong dependency of forward SHG on sample radius.
On the basis of the vector diffraction theory and Green＇s function method, this paper investigates the effects of refractive index mismatch on second-harmonic generation （SHG） microscopy. The polarization distribution and SHG intensity are calculated as functions of the sample radius and probe depth. The numerical results show that refractive index mismatch can result in peak intensity degradation, increase secondary lobes and extension of second- harmonic polarization distribution. Because of the attenuation of polarization intensity, the detected SHG intensity significantly decreases with increasing probe depth, which can limit the imaging depth of SHG microscopy inside thick samples. Forward SHG intensity decays slowly than backward SHG, due to the combination of extension second-harmonic polarization distribution and strong dependency of forward SHG on sample radius.
