摘要
传统的云纹干涉法是采用双光束精确对称入射的方式。在云纹干涉法精调零场的基础上,微旋一束入射光使双光束呈现微小的非对称,视场中出现稀疏的载波条纹。通过稀疏载波条纹在物体变形前后的变化对小应变进行直接分析,形成了一种基于对称的非对称双光束入射云纹干涉法。理论分析表明,该方法可近似给出全场诸像素点的正应变值;相对于传统的云纹干涉法,应变分析灵敏度大幅提高,达到了微应变或亚微应变的量级,应变测量精度有望得到改善,使光测法研究微小应变成为可能。
Traditional moire interferometry adopts the mode of double beams of light symmetrical incidence.One of the beams is turned which make them unsymmetrical slightly after the delicate adjusting of zero field of moire interferometry.And exiguous carrier wave fringes appears in the visual field.The tiny strain can be analyzed directly using the change of the exiguous carrier wave fringes of before and after deformation of an object.A new method of double beams of light unsymmetrical incidence moire interferometry based on symmetrical incidence was formed.Theoretical research indicated that the strain value of the whole field could be obtained approximately via the method.Comparing with traditional moire interferometry,the strain sensitivity was improved and could reach to or be less than 1με.Perhaps this can make the precision amelioration and tiny strain measurement by ootics oossible.
作者
曹宇东
王世斌
祁双喜
CAO Yu-dong;WANG Shi-bin;QI Shuang-xi(Institute of Fluid Physics,China Academy of Engineering Physics1,Mianyang 621900,P.R.China;Institute of Mechanics Engineering,Tianjin University2,Tianjin 300072,P.R.China)
出处
《科学技术与工程》
2007年第20期5213-5216,5236,共5页
Science Technology and Engineering
基金
国防重点预研课题基金资助
关键词
云纹干涉
非对称
稀疏载波条纹
小应变
灵敏度
Moire interferometry
unsymmetry
exiguous carrier Wave fringes
tiny strain
sensitivity
