摘要
光热位移偏转技术结合横向光热偏转技术可用于研究薄膜样品的热膨胀系数.本文以SiO_2、TiO_2、ZrO_2、MgF_2、ThF4等单层光学薄膜为例.报道相关的实验方法及实验结果.
Thermal expansion coefficients of optical the films can be measured by means of the combination of photothermal displacement optical team deflection technique and transverse photothermal dcffection technique. In this paper, single layers of SiO2, TiO2, ZrO2, MgF2 and ThF4 are taken as examples to show the experimental methods and results.
出处
《光学学报》
EI
CAS
CSCD
北大核心
1990年第4期369-373,共5页
Acta Optica Sinica
关键词
光学薄膜
热膨胀系数
光热偏转技术
photothermal deflection
thermal expansion coefficients of thin films.
