摘要
本文给出了一种新的X射线荧光分析数学模型——层模型。在层状结构样品假设下借助算符和矩阵建立起来的非线性数学模型。层模型具有特点:(1)能够描述任意厚度样品的各次元素间效应(尤其是增强效应);(2)模型系数是具有清晰物理意义、独立于样品化学组分、可由标样测定的常数。非线性规戈4方法被用于设计层模型软件LM—88。通过用^(241)Am同位素源γ射线激发五元样品的能量色散X射线荧光分析,对层模型进行了验证,理论相对强度与实测相对强度的相对误差不超过7.00%
A new mathematical model for XRF analysis——Layer Model is described. The model, based on the hypothesis of multilayer structure sample, is established by means of operators and their matrices, Compared with existing XRF mathematical models, the model includes a infinite sequence of interelement effects in a sample of arbitrary thickness. A nonlinear programming is applied to design the model software LM-88. The model is experimentally verified by an energy dispersive XRF analysis of quinary compositions. Relative errors between theoretical and measured relative intensities are within 7.00%.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1990年第4期35-41,共7页
Spectroscopy and Spectral Analysis
