摘要
本文阐述了利用面阵ＣＣＤ、微机对衬布上浆厚度不匀信号的处理方法，讨论了系统的组成；数据的采集及其实验结果．本项目应用研究不仅为上浆厚度分析提供了新的手段，而且为把面阵ＣＣＤ技术应用于纺织检测研究奠定了基础．
The paper shows process way for thickness unevenness of cloth-lining starched. In this paper,we discuess system construction and data collection and experiment result. The application research not only provide new analysis way for thickness starched but also lay foundation for textile testing research using 2-D CCD.
出处
《天津纺织工学院学报》
北大核心
1997年第2期55-61,66,共8页
Journal of the Tianjin Institute of Textile Science and Technology
