摘要
瞬态电流测试(IDDT Testing)作为传统电压测试和稳态电流测试(IDDQ Testing)方法的一个补充,越来越受到研究领域和工业界的关注。针对不同的故障类型,基于瞬态电流测试的测试方法也有所不同。这里提出了一种关于时延故障的测试产生算法,该算法利用3个向量来激活时延故障。实验结果表明该测试产生算法用于检测时延故障是可行的。
Recently, Ioor testing used as a complement of the voltage testing and IDDQ testing gains more and more attention in the research and industry field. Directing at different fault models, the test methods based on loor testing are also different. This paper proposes a new algorithm for test generation for delay fault. The algorithm uses three patterns to activate delay fault. Experiment results prove this test generation algorithm is feasible.
出处
《微处理机》
2007年第3期14-17,20,共5页
Microprocessors
基金
国家自然科学基金项目资助(No:60173042)
