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辐照和电流注入下电缆耦合响应的计算 被引量:7

Calculation of braided shielding cable responses in radiation and pulsed current injection environments
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摘要 采用传输线模型,利用时域有限差分方法计算了辐照和电流注入两种试验环境中电缆屏蔽层电流对芯线的耦合响应,并对响应规律进行了研究。计算结果表明:电流注入时近端负载电压峰值最小,辐照时次之,电流注入时远端最大;负载电压峰值、负载能量与屏蔽层电流源幅度等比例变化;相比较前沿的变化而言,改变屏蔽层电流源前沿对负载电压峰值和负载能量的影响不大;屏蔽层电流源半高宽较小时,负载电压峰值、负载能量与半高宽是非线性关系,屏蔽层电流源半高宽较大时,负载电压峰值、负载能量与半高宽成线性关系;电缆较短时,改变电缆长度对负载电压峰值有影响,而电缆较长时,只会影响电缆负载能量。 Using the transmission line model, the response in radiation and pulsed current injection(PCI) environments of braided cable shields coupling to inner conductor is calculated by finite-difference time-domain method. The numerical results indicate that the peak value of voltage of radiation environment is larger than the near port of PCI environments, and the far port is the biggest. The peak value of voltage and the integrate value of absolute value of voltage are in direct ratio with the current amplitude of shields. And the value is independent of the rise time. The value is non-linear with the full wave at half maximum(FWHM) for small FWHM, but it is just the opposite for big FWHM. The peak value and the length of cable are changed in the same ratio for short cable, as the length changes, the peak value becomes a constant. The integrate value is in direct ratio with the length.
出处 《强激光与粒子束》 EI CAS CSCD 北大核心 2007年第5期868-872,共5页 High Power Laser and Particle Beams
基金 国防科技基础研究基金资助课题
关键词 辐照 脉冲电流注入 耦合 负载响应 Radiation Pulsed current injection Couple Load response
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参考文献7

  • 1黄聪顺,周启明.高空电磁脉冲作用下地面电缆屏蔽层感应电流的数值模拟[J].强激光与粒子束,2003,15(9):905-908. 被引量:35
  • 2马良.地面铺设、埋地和部分埋地缆线的HEMP响应研究[D].西安:西北核技术研究所,2006.
  • 3祝敏,刘顺坤,周辉,孙培云,谢彦召,田吉波.电磁脉冲对电缆的耦合效应实验研究[J].强激光与粒子束,2001,13(6):761-765. 被引量:23
  • 4周辉,李宝忠,程引会,等.编织屏蔽电缆EMP耦合和X光响应的理论计算[C]//计算物理学会陕西分会第一届学术会议文集.1998.
  • 5Higgins D F,Barbara S.Time-domain calculation of the leakage of SGEMP transients through braided cable shields[J].IEEE Trans on Nuclear Science,1989,36(6):2042-2049.
  • 6Higgins D F,Barbara S.SGEMP leakage through satellite cable shields:the importance of transfer admittance coupling and its implications on testing[J].IEEE Trans on Nucl,1980,27(6):1589-1595.
  • 7Vance E F.Coupling to shielded cables[M].Beijing:People's Posts and Telecom Press,1988.

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