摘要
用循环伏安法对半导体Cdse_xTe_(1-x)薄膜电池的光溶解性能进行了研究。在1mol/L KCl溶液中测量光溶解产物的阴极还原特性,考察了在多硫化钠,多硫化钾及铁氰化钾溶液中的光腐蚀行为。用此方法还研究了薄膜电极表面的光刻蚀过程和pH的影响,并用X射线光电子能谱分析光刻进行不同时间后,电极表面发生的变化。
Photodissolution behaviours of semiconductor CdSe0.63 Te0.37 thin film electrodes were investigated by cyclic voltammetry.By measuring the I-V performances of cathodic reduction processes for the products of photodissolution in Imol/L KC1 solution,the photocorrosion of CdSe0.63Te0.37 thin film electrodes in polysulfide and ferro-ferricyanide solutions was tested.Surface photoetching processes and effects of pH was also studied by this method.X-ray photoele-ctron spectroscopy was used to analyze the changes of thin film surface prior to and after photoetching.
出处
《感光科学与光化学》
CSCD
1990年第2期113-120,共8页
Photographic Science and Photochemistry
关键词
光溶解
薄膜电极
PEC电池
循环伏安
Photodissolution,photocorrsion,photoetching,thin film electrode,cyclic voltammetry,X-ray photoelectron spectroscopy
