摘要
讨论了使测试访问机制最优化的几个问题,然后试着采用遗传算法来解决这些问题,在两个SoC上用遗传算法进行实验,把实验结果与采用整数线性规划方法(Integer Linear Programming,ILP)的结果进行比较可以发现效果改善的很明显。实验结果说明采用遗传算法对测试访问机制进行最优化处理的效果要好于ILP。
Several problems about optimizing test access mechanism are discussed. Then we try applying the Genetic Algorithm to solve these problems, experimenting on two SoCs. Then we compare the experiment results with those of Integer Linear Programming （ILP）, finding that the performance improvement is obvious. So we conclude that the effect of applying the Genetic Algorithm to optimize TAM is better than the effect of the Integer Linear Programming （ILP） .
出处
《微电子学与计算机》
CSCD
北大核心
2007年第6期207-210,共4页
Microelectronics & Computer
关键词
测试访问
嵌入式核
系统芯片
测试访问机制
遗传算法
test access
embedded core
system-on-chip （SoC）
test access mechanism （TAM）
genetic algorithm
