摘要
用半导体元件对平板进行加热，用ＶＩＴＡ法和ｍｕ－ｌｅｖｅｌ法两种条件采样技术研究了固壁温度对湍流相干结构的影响，改进了Ｔｉｅｄｅｒｍａｎ等人提出的“归组”方法，并且用“归组”的ＶＩ－ＴＡ法和ｍｕ－ｌｅｖｅｌ法研究了固壁加热对湍流猝发平均周期的影响．实验结果表明，固壁加热使得湍流脉动速度均方根值变大，条件采样检测到的事件数量增多。
In this paper, two conditional sampling techniques,VITA and mu-level algorithms were used to investigate the wall temperature influence on turbulence coherent structure in heated wall. ``Grouped'' method proposed by Tiederman et al. was improved, and the advanced ``Grouped'' method was used with VITA and mu-level technique in analizing the effects caused bywall heating on average bursting period. Experiments indicate that the U rms and detected results of conditional sampling method increase, but average bursting period remains the same.
出处
《力学学报》
EI
CSCD
北大核心
1997年第1期17-23,共7页
Chinese Journal of Theoretical and Applied Mechanics
基金
国家自然科学基金
关键词
相干结构
条件采样
猝发
归组
湍流
coherent structure, conditional sampling, burst, grouped
