摘要
用傅立叶变换红外光谱、X射线衍射谱、X射线光电子谱和拉曼散射技术分析了能量为GeV量级的S、Fe、Xe、和U离子,以及120keV的H离子在室温下辐照多层堆积C60薄膜的结构稳定性,即快重离子在C60薄膜中由高密度电子激发引起的效应,主要包括C60分子的聚合、分子结构的损伤、新的高温-高压相的形成和晶态向非晶态的转变。
The irradiation experiments of thin C60 film stacks were performed by S, Fe, Xe, and U ions with energy of GeV delivered by HIRFL at Lanzhou in China,and Unilac in Germany respectively, and 120keV H ions delivered by ion Implantor at Institute of Modem Physics, Chinese Academy of Sciences. The structural stability of C60 films under the irradiation by swift heavy ions or high density electronic excitation effects were analyzed by means of FTIR, XRD, XPS and Raman scattering spectroscopies. The analysis results indicated that the irradiations induced the polymerization and destruction of C60 molecules, some components of high-temperature-high-pressure phase of the polymerized C60 appeared in the irradiated C60 films and finally amorphous transformation of C60 films took place. The electronic energy transfer dominates the damage process of C60 films. The partial recovery of the damage in irradiated C60 films at certain electronic energy loss is attributed to an annealing effect of high density electronic excitation.
出处
《核技术》
EI
CAS
CSCD
北大核心
2007年第4期323-327,共5页
Nuclear Techniques
基金
国家自然科学基金资助项目(10175084
10675150)
关键词
结构稳定性
C60薄膜
快重离子
高密度电子激发效应
Structural stability, C60 films, Swift heavy ions,High density electronic excitation effect
