摘要
建立一个有效的三明治隧穿模型研究在Pr1-xCaxMnO3薄膜中电流脉冲引起的电阻改变(EPIR)性质,发现载流子在三明治结构各区域间的隧穿概率以及在不均匀界面层的导通概率对材料的EPIR值产生重要影响.还研究了电流-电压曲线中的迟滞效应,得到的结果与近年来的文献报道一致.
We developed a effective tunneling model to study the electric-pulse-induced resistive switching （EPIR） effect in PCMO films, and find that the tunneling probability of the charge transport at interfaces plays an important role in the EPIR effect. We also study the nonvolatile characteristics and the hysteretie current-vohage curve in the PCMO films, the calculated results consistent with the recent experimental data. This electric-pulse-induced resistive switching effect at room temperate has excellent potential of application.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2007年第3期1637-1642,共6页
Acta Physica Sinica
基金
国家自然科学基金(批准号:10574021)资助的课题.~~
关键词
强关联电子系统
金属
氧化物界面
隧穿
strongly correlated electron systems, metal-oxide interface, tunneling
