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智能直流稳压电源内阻测量装置的研制 被引量:4

Developing the intelligent instrument of measuring internal resistance of DC power supply with constant voltage
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摘要 本文介绍了一种新的直流稳压电源内阻测量方法,研制了基于该测量方法的智能直流稳压电源内阻测量装置。文中详细介绍了该装置的硬件组成、软件设计和工作原理,并给出其电路原理图和程序流程图。该装置采用单片机智能控制,自动化程度高、测量快速准确,体积小、功耗低,具有较好的实用价值。实际应用表明,该装置抗干扰性强,具有较高的稳定性和可靠性。 The paper introduced a new method to measure internal resistance of the DC power supply with constant voltage. A new kind of measuring instrument based on the method was developed. The composition of hardware, the design of software and working principle were described in detail in this paper. Its circuit principle diagram and procedure diagram were given too. Controlled by SCM, the device can work automatically, quickly and accurately. It has a high usage value for its features of small scale and low power consumption. Practice application of the device proved that it has a high anti-interference performance, good stability and reliability.
作者 秦辉
出处 《电子测量技术》 2007年第2期8-10,71,共4页 Electronic Measurement Technology
基金 河北省科技攻关项目(1062135831)资助
关键词 直流稳压电源 内阻 硬件设计 软件设计 DC power supply with constant voltage internal resistance hardware design software design
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  • 1陈光(ju).现代测试导论[M].电子科技大学出版社,2002..
  • 2肖明珠.测量误差对测量信息的影响[J].电子测量与仪器学报,:834-834.
  • 3W. Woeger, Probability Assignment to Systematic Deviations by the Principle of Maximum Entropy [J]. IEEE Transaction of Instrumentation and Measurement, Vol.36, NO 2, 1987,P655-658.
  • 4E.T.Jaynes, On the Rationale of Maximum Entropy Methods[J]. Proceedings of the IEEE, Vol.70,NO 9,1982,p539-552.
  • 5T. Schreiber, Measuring information Transfer, Physical Review Letters,Vol 85,N0 2,2000,P461-465.
  • 6Johnson, G. H.. Challenges of high supply currents during VLSI test [C]. Test Conference, Proceedings,International. 2000: 1013-1020.
  • 7Hailong Cui, Seth, S. C., Mehra, S. K.. A novel method to improve the test efficiency of VLSI tests [C].Design Automation Conference, Proceedings of ASPDAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design, Proceedings.2002 : 499-504.
  • 8Ivanov, A., Lombardi, F., Metra, C.. vip Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates [J]. Design & Test of Computers,IEEE. 2004, 21 (4): 274-276.
  • 9Chua, L.O., Desoer, C.A., Kuh, E.S. Linear and Nonlinear Circuits.McGraw-Hill, Inc 1987.
  • 10Hayt, W.H., Kemmerly, J.E. Engineering Circuit Analysis (3rd edition), McGraw-Hill, Inc 1978.

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