摘要
在一个ＰＣ基高速高分辨率仪器卡上实现超低平均功耗器件的Ｉ－Ｖ曲线测量．采集５１２个数据只要５１．２μｓ，避免因过高平均功耗而损坏器件．ＰＣ基仪器卡自带时钟和单斜波电压产生器，使用功能为１８ＭＨｚ取样率和１０ｂｉｔ分辨率的Ａ／Ｄ器件和存取时间为１５ｎｓ的缓存存贮器，分辨率优于一般存储示波器，测量系统对ＰＣ／ＸＴ以上的微机兼容．系统还可进行多通道瞬态测量，用于同步分析多通道窄脉冲信号，一个软件包可以完成所有的控制、测量与数据处理．
A PC-based high-speed high-resolution instrument is reported to measure the I-V curves of a very low average power device to avoid the possible damage to the devices.A very short single pulse I-Vcurve measurement(512 data with a total time of 51.2μs)was performed.High-speed high-resolution devices(A/D converter with 10-bit resolution at maximum sampling rate of 18 MHz,and SRAM with 15 us access time)were used.A builtin clock,a ramp voltage generator and a sophisticated design of the data acquisition were also used.The instrument has a better resolution than most sampling oscilloscopes,and a much higher ratio of performance over price.This instrument is also capable of performing multi-channel transient measurements to analyze multi-channel single pulse signals simultaneously.It is compatible with PC/ XT and up.All controls,measurements and data treatments are within a software package.
出处
《福州大学学报（自然科学版）》
CAS
CSCD
1996年第6期18-20,共3页
Journal of Fuzhou University(Natural Science Edition)
基金
国家教委基金
关键词
半导体
PC仪器
甚低平均功耗
伏安曲线
自动测量
PC instrument
high-speed and high-resolution
very low average power consumption
I-V curve measurements
