摘要
基于对IC测试接口原理和系统结构的阐释,具体针对型号为SL431L的电源芯片,提出改进测试电路的方法,电压测试值的波动范围小于3mV。
Based on the principals of IC test interface and the structures of test systerm, methods of improving test circuits on type SIA31L power IC is proposed. The change rang of measurement results be within 3mV.
出处
《中国集成电路》
2007年第2期72-74,92,共4页
China lntegrated Circuit
