摘要
随着软件的发展,测试技术也在发展。MC/DC即修改条件/判定覆盖,是一种较新的结构覆盖准则,它是在C/DC(条件/判定覆盖)的基础上发展起来的。与其它结构覆盖准则相比,它只是线性地增加了测试用例的数量,使得软件测试更加具有可操作性。而对于测试来说,测试用例的选择和优化是至关重要的。在探讨MC/DC的基础上,利用MC/DC的特点,初步提出了利用MC/DC进行测试集减少的方法,使得减少后的测试集与原测试集对测试需求有着相同或相似的覆盖率,并对此方法的利弊做了一定的分析。
With the development of software, the testing technology is developing. MC/DC is a newer structure coverage criterion, which is based on C/DC （condition/decision coverage）. Comparing other structure coverage criterion, it only linearly adds quantity of test cases, which makes software testing easier. The choice and prioritizing of test case is very important to testing. A method is put forward that can reduce the test-set in using MC/DC. The same coverage is provided, and advantages and disadvantages of this method are analyzed.
出处
《计算机工程与设计》
CSCD
北大核心
2006年第23期4487-4490,共4页
Computer Engineering and Design
