摘要
最近的研究表明．随机粗糙表面是自仿射的和多尺度的．因而表面轮廓的高度分布方差、斜率和曲率的方差不再是唯一的．本文基于分形几何理论提出了一种新的粗糙表面表征方法，使用Ｗｅｉｅｒｓｔｒａｓｓ—Ｍａｎｄｅｌｂｒｏｔ函数得到粗糙表面的分形参数──“固有”参数，而这些参数可以提供任何长度尺度的粗糙度结构信息．
The recent studies of roughness measurements on a variety of machined surfaces have shown that their topographies are self-affinity and multiscale. This implies that the statistical parameters, such as the variances of the height, the slope and the curvature used for characterization are not unique for a particular surface.In this paper, the Weierstrass-Mandelbrot fractal function is used to introduce a new and simple method of roughness characterization.
出处
《现代计量测试》
1996年第4期23-26,共4页
Modern Measurement and Test
