摘要
运用傅里叶红外显微光谱技术测量了ＨｇＣｄＴｅ晶片上透射光谱分布，并通过编程处理，得到ＨｇＣｄＴｅ晶片组分分布和截止波长分布图。
It is described in this paper that Fourier Transform infrared (FTIR) microscopy is of use for mapping the transmission spectrum of HgCdTe wafer, by which the distribution diagram of the composition and cut-off wave-length of the wafer can be estimated in computer with proper software.
出处
《红外与激光工程》
EI
CSCD
1996年第6期36-38,共3页
Infrared and Laser Engineering
关键词
傅里叶谱仪
红外光谱仪
HgCdTe晶片
测量
Subject Fourier spectrometer Infrared spectrometer Mercuty cadmiun telluride Composition (property ) Cut- off frequency Distribution(property)
