摘要
介绍了一种实用的校正基体效应的方法。该方法在某铅锌矿2号矿体群的应用表明:X射线荧光法分析结果与化学分析结果相比较,在规定的允许偶然误差限内,对铅和锌其合格率分别为81%和79%,X射线荧光法重复分析铅、锌含量的平均相对误差均小于1%。
A practical method of correcting matrix effect is described. Test on Pb-Zn orebody groupNo 2 in a Pb-Zn deposit shows that within the range of allowable accidental error the samples analyzedby XRF analysis technique have a acceptance ratio of 81%Pb and 79%Zn in comparison with chemi-cal analysis, and that the average relative error of repeated analysis by XRF method is less than 1%.
关键词
铅锌矿
含量
基体效应
校正
荧光
X-ray fluorescence analysis
matrix effect
Pb-Zn deposit
