摘要
本文通过实验研究了难电离元素Ⅰ（Ｅｉ＝１０．４５ｅＶ）对交流电弧等离子体中的低、中和高电离电位各种痕量元素谱线强度的增强作用，结果与加入易电离元素Ｌｉ（Ｅｉ＝５．３９ｅＶ）所得数据进行比较。为了讨论这种增强效应的机理，测量了等离子体的温度和电子密度。
The enhancement of feet of non-easily ionized element Ⅰ (Ei = 0. 45eV ) on thespectral line intensities of various trace elements with low, intermediate and high ionizationpotentials was investigated by experiments. The results were compared with data obtainedwith easily ionized element Li (Ei=5. 39eV ). In order to discuss the mechanism of the enhancement effect, some of the plasma parameters (Texc,ne ) were measured.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1996年第4期51-55,共5页
Spectroscopy and Spectral Analysis
关键词
难电离元素
光谱线强度
交流电弧
等离子体
Non-easily ionizd element, Spectral line intensity, A C arc plasma
