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一种新的二水平多因素系统两两组合覆盖测试数据生成算法 被引量:21

A New Pairwise Covering Test Data Generation Algorithm for the System with Many 2-Level Factors
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摘要 作者系统地研究了使用已有方法对二水平多因素系统(以下简称SM2)生成的两两组合覆盖的测试数据,针对已有方法对该具体问题效果并不理想的情况,利用组合分析方法,给出了一种新的SM2测试数据生成算法,与几种现有的方法相比,生成的测试数据具有数量少、效率高的优点.将其应用于Linux的一些源代码测试以及软件配置测试的测试方案设计,结果表明生成的测试数据具有较高的代码覆盖率和错误检测能力. Pairwise testing is very practical and effective. Much research has been done in the test data generation algorithm. The authors first study pairwise testing data generated for SM2 (System with Many 2-level factors) with the existed methods, then present a new algorithm by combinatorial analysis to avoid the shortages that the existed methods are not good enough for SM2. This algorithm can generate the most effective test suite with smaller size. The authors use the result to test the Linux code and design the test plan for the software configuration testing. It shows the test data generated by the algorithm has high code coverage and fault detection ability.
出处 《计算机学报》 EI CSCD 北大核心 2006年第6期841-848,共8页 Chinese Journal of Computers
基金 国家杰出青年科学基金(60425206) 国家自然科学基金(60403016 60373066) 江苏省自然科学基金(BK2005060)资助.
关键词 软件测试 测试数据 算法 组合覆盖 software testing test data algorithm combinatorial cover
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参考文献18

  • 1Kuhn D.R.,Gallo A.M..Software fault interactions and implications for software testing.IEEE Transactions on Software Engineering,2004,30(6):418~421
  • 2Kuhn D.R.,Reilly M.J..An investigation of the applicability of design of experiments to software testing.In:Proceedings of the 27th NASA/IEEE Software Engineering Workshop,NASA Goddard Space Flight Center,2002,4~6
  • 3DeCock et al.On finding mixed orthogonal arrays of strength 2 with many 2-level factors.Statistics & Probability Letters,2000,50:383~388
  • 4Hedayat A.S.et al.Orthogonal Arrays:Theory and Applications.New York:Springer-Verlag,1999
  • 5Kobayashi N.,Tsuchiya T.,Kikuno T..A new method for constructing pair-wise covering designs for software testing.Information Processing Letters,2002,81(2):85~91
  • 6Williams A.W..Determination of test configurations for pairwise interaction coverage.In:Proceedings of the 13th International Conference on the Testing of Communicating Systems(TestCom 2000),Ottawa Canada,2000,59~74
  • 7Williams A.W..Software component interaction testing:Coyerage measurement and generation of configurations[Ph.D.dissertation].Ottawa-Carleton Institute for Computer Science,School of Information Technology and Engineering,University of Ottawa,Canada,2002
  • 8Cohen D.M.etal.The AETG system:An approach to testing based on combinatorial design.IEEE Transactions on Software Engineering,1997,23(7):437~444
  • 9Cohen D.M.et al.The combinatorial design approach to automatic test generation.IEEE Software,1996,13(5):83~87
  • 10Cohen D.M.et al.New techniques for designing qualitatively independent systems.The Journal of Combinational Designs,1998,6(6):411~416

二级参考文献25

  • 1[1]Chen T Y,Lau M F. A new heuristic for test suite reduction.Information and Software Technology, 1998, 40(5/6) : 347~354
  • 2[2]Chen T Y, Lau M F. A simulation study on some heuristics for test suite reduction. Information and Software Technology,1998, 40(13): 777~787
  • 3[3]Lee J G, Chung C G. An optimal representative set selection method. Information and Software Technology, 2000, 42 (1):17~25
  • 4[4]Chen T Y,Lau M F. Dividing strategies for the optimization of a test suite. Information Processing Letters, 1996, 60(3): 135~141
  • 5[5]Johnson D S. Approximation algorithms for combinatorial problems. Journal of Computer and System Sciences, 1974, 9(3): 256~278
  • 6[6]Harrold M J,Gupta R,Soffa M L. A methodology for controlling the size of a test suite. ACM Transactions on Software Engineering and Methodology, 1993, 2(3): 270~285
  • 7[7]Chen T Y,Lau M F. Heuristics towards the optimization of the size of a test suite. In: Proceedings of the 3rd International Conference on Software Quality Management, Seville, Espagne, 1995, 2:415~424
  • 8[8]Jones J A, Harrold M J. Test-suite reduction and prioritization for modified condition/decision coverage. In: Proceedings of ICSM'01, Florence, Italy, 2001, 11:92~102
  • 9[9]Wong W E, Horgan J R, London S et al. Effect of test set minimization on fault detection effectiveness. In: Proceeding of the 17th International Conference on Software Engineering, Seattle, Washington DC, 1995. 41~50
  • 10[10]Wong W E, Horgan J R,Mathur A P et al. Test set size minimization and fault detection effectiveness: A case study in a space application. In: Proceeding of the 21st Annual International Computer Software and Application Conference of COMPSAC 97, Washington DC, 1997. 522~528

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