摘要
KMgF3∶Eu晶体中Eu3+→Eu2+的转换率在低浓度掺杂时接近100%,完全转换的饱和掺杂摩尔分数为0.29%.实验条件下,KMgF3晶体的X射线1 h辐照损伤可在约100 h后恢复;KMgF3∶Eu2+晶体经X射线辐照后,360 nm锐峰发射强度略有降低.不同剂量的γ射线辐照,KMgF3晶体热释光曲线的各个温度峰强度变化明显不同,即使小剂量辐照,造成的损伤也较难恢复,如γ射线辐照剂量为103Gy时,辐照损伤的恢复时间约需30 d.KMgF3∶Eu2+晶体360 nm锐峰发射强度随γ射线辐照剂量增大而呈线性降低.
The conversion of Eu^3＋→Eu^2＋ in KMgF3： Eu is almost the saturant dopant is 0. 29% molar fraction. The irradiation damag 100% at the low dopant concentration and e of KMgF3 crystal by 1 h X-ray irradiation can recover in about 100 h under experimental condition. After KMgF3： Eu^2＋ crystal was irradiated by X-ray, the sharp peak emission intensity at about 360 nm cuts down slightly and the stimulated spectrum was not observed. KMgF3 The changes are obviously different for all thetemperature peak intensities of TLS glow curves crystal irradiated by γ-ray of different dosages, even if the damage caused by a little dosage irradiation is relatively hard to recover, for example, if the diation damage is about 30 d. The sharp peak γ-ray irradiation dosage. dosage of γ-ray irradiation is 10^3 Gy, the recovery time of irraemission intensity at 360 nm drops linearly with the growth of
出处
《高等学校化学学报》
SCIE
EI
CAS
CSCD
北大核心
2006年第6期995-998,共4页
Chemical Journal of Chinese Universities
基金
国家重点基础研究发展规划项目(批准号:G1998061323)
国家自然科学基金(批准号:90201032)资助
