摘要
本文主要论述用于通信、雷达等电子系统中微波半导体器件的常见失效模式,并分析其主要失效机理。为使器件达到高可靠水平,提出可靠性设计的相应对策。
Some common failure modes of microwave semiconductor devices for electronic systems, suchas communication and radar,are described. Their main failure mechanisms are analyzed.In order to fabricate the high reliable devices,the design for reliability is completed.
出处
《半导体情报》
1990年第5期28-34,共7页
Semiconductor Information
