摘要
介绍新型X射线激发光电子成像电子能谱仪配置新一代DLD光电子检测系统优点、结构和在能谱和成像应用方面特点。
The delay-line detector（DLD）system represents the next generation of photoelectron detectors for electron spectrometer of imaging XPS etc. Its advantages, configurations and features in application to both Spectroscopes and X-ray photoelectrons imaging are introduced in this paper.
出处
《现代仪器》
2006年第1期13-14,共2页
Modern Instruments
