摘要
根据云母折射率的色散关系和相位延迟随波长变化关系,给出了一种测量双折射率比较精确的方法。通过测量云母材料的厚度和相应厚度情况下作为λ/4波片使用所对应的波长,利用相位延迟与波长及厚度函数关系式直接求得云母的双折射率。该方法简便,测量精度达到10-5量级。
A new accurate method for measuring the birefringence of muscovite mica has been reported in terms of the dispersion relations of the indices and the variety relations between the phase delay and the wavelength. Through measuring the thickness of mica plates and the wavelengths at which they act as quarter wave phase retarders,the hirefriugence can be obtained in terms of the function relation between the phase delay, the wavelength and the thickness. This method is simple and the accuracy of the measurement is in the order of 10^-5.
出处
《激光技术》
CAS
CSCD
北大核心
2006年第1期99-100,共2页
Laser Technology
关键词
光学器件
白云母
双折射率
延迟相位
光强
optical devices
muscovite mica
birefringence
phase retardation
intensity
