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微通道板非晶态Al_2O_3电子透射膜 被引量:19

Amorphous State Al_2O_3 Electron Transmission Film at the Input of MCP
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摘要 文中介绍了MCP非晶态Al2O3电子透射膜在成像器件中的作用,阐述了膜层的选择、形成条件与方法,给出了膜层形成及其与辉光气体放电的关系,测量了膜层及带膜MCP的某些特性,并进行了初步分析和讨论. This paper introduces the function of amorphous state Al2O3 electron transmission film at the input of MCP in the imaging devices, expounds the selection, forming condition and method of the film,gives the relation between film forming and glow discharge of the gases. Some characteristics of the film and MCP with film are measured. Preliminary analysis and discussion about it are carried out.
出处 《电子学报》 EI CAS CSCD 北大核心 1996年第8期1-5,共5页 Acta Electronica Sinica
关键词 微通道板 电子透射膜 离子反馈 象增强器 Microchannel plate Electron transmission film Ion backfeed Intensifier
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参考文献4

  • 1陈国平,薄膜物理与技术,1993年
  • 2Zhang Yingji,Nuclear Instruments and Methods in physics Res,1991年,302卷,1期,76页
  • 3田景全,SPIE 1230,1990年
  • 4顾培夫,薄膜技术,1990年

同被引文献59

  • 1姜德龙,吴奎,王国政,李野,高延军,端木庆铎,富丽晨,田景全.微通道板离子壁垒膜及其特性[J].发光学报,2004,25(6):737-742. 被引量:2
  • 2端木庆铎,姜德龙,田景全,李野,高延军,王国政,吴奎,富丽晨.微通道板电子透射膜及其粒子透过特性的研究[J].电子学报,2005,33(5):904-907. 被引量:7
  • 3闫金良.微通道板离子阻挡膜[J].应用光学,1996,17(1):12-14. 被引量:4
  • 4田景全,姜德龙,吴奎.测量MCP特性参数的紫外光电法[J].电子学报,1990,18(5):121-123. 被引量:8
  • 5普尔克尔HK.玻璃镀膜[M].北京:科学出版社,1988.232-234.
  • 6Zou Yisong. Electron Vacuum Image Devices and Theory Analysis [ M]. Beijing: National Defence Industry Press, 1989.
  • 7Howorth J R. Exploring the limits of performance of third generation image intensifier [ J]. Vacuum, 1980, 30( 11 ):551-555.
  • 8Timothy W. Sinor, Joseph P Estrera. An analysis of electron scattering in thin dielectric films used as ion barriers in generation Ⅲ image tubes [J]. SPIE, 2003, 4796:23-32.
  • 9Tian Jingquan, Zhang Baifu, Fu Lichen, et al. UV-photo-method for measurement of MCP characteristic parameter [,I ]. SPIE, 1990, 1230:228-230.
  • 10Timothy W. Sinor, Joseph P. Estrera. An analysis of electron scattering in thin dielectric films used as ion barriers in generation Ⅲ image tubes[J]. SPIE,2003, (47%) :23 - 32.

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