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多线阵CCD拼接检测宽幅PS版表面缺陷的研究 被引量:8

Study on Inspection of Wide PS Plates Quality Based on Linear CCD Assembling Technique
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摘要 提出采用多线阵CCD拼接对宽幅PS版表面缺陷进行检测的方法。用多个线阵CCD对宽幅面PS版表面进行分段成像,利用同步驱动使多个CCD并行工作,通过PCI高速数据采集系统将图像送入计算机,再通过图像处理算法进行缺陷检测,检测幅面宽度为1.2 m,分辨率为0.1 mm,检测速度为10m/min。 A novel wide PS plates quality inspection scheme was developed with multi-optical imaging systems linear COD assembling technique. This method can overcome the shortcoming of the conventional linear OOD assembling methods, extend the measuring range of COD and make the system adjust more conveniently. PS plates surface is dived into several segments and imaged on several COD sensor. These COD sensors are driven synchronously and parallel in order to collect data in high speed of 10 m/min. The measurable width of this system reaches 1.2 m,and the resolution can be up to 0.1 mm.
出处 《光电子.激光》 EI CAS CSCD 北大核心 2005年第11期1350-1354,共5页 Journal of Optoelectronics·Laser
关键词 宽幅面PS版 多线阵CCD拼接 同步驱动 并行数据采集 在线检测 wide PS plates multi-linear CCD assembling technique synchronous drive high-speed online inspection quality inspection
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