摘要
大气折光是限制EDM测高精度的主要因素。从EDM测高的基本原理入手,结合实验数据分析了点、线折光系数变化的基本规律及其对EDM测高的影响。针对目前还不能从仪器的构造上自动消除折光影响,提出了一种求解大气折光改正系数的新思路。
This main effect on height survey EDM is atmospheric refraction. Starting with the fundamental principles of height survey EDM and in combination with the experiment data, this paper analyzes the basic law of the atmosphere point and line refraction coefficient and their effect on EDM. In view of the status quo, the author takes the lead in putting forward a method that can evaluate the atmosphere vertical refraction.
出处
《重庆科技学院学报（自然科学版）》
CAS
2005年第3期40-42,共3页
Journal of Chongqing University of Science and Technology：Natural Sciences Edition
关键词
EDM测高
点折光系数
线折光系数
大气折光改正模式
height survey EDM
point-refraction coefficient
line-refraction coefficient
correction pattern of the atmosphere refraction
