摘要
“光学零件表面疵病”曾在国家标准GB1031－68及GB1185－89中做过专门描述。研究发现，这些标准与国际上一些国家的相关标准及测试方法相差较大，而最近国际光学委员会推荐的一个不同用途光学元件的疵病指标值得注意[1]。本文在介绍了一些国外标准的基础上，侧重分类描述了当今世界上具有代表性的疵病检验方法、原理及各自的特点，旨在为我国光学界同行在应用、研究及制定相关标准时参考。文后作者提出了在光学元件的疵病检验和标准制定方面的一些粗浅看法。
Surface imperfections on optical components'have been decribed in nationalstandard GB1031 - 68 and GB1185 - 89. After study, we find that standard and testingmethod have conciderable different with external standards,and the thresholds for surfaceimperfections recommended by the International Commission for Optics (ICO)merits atten-tion. In this article,we brief on some external standards,and lay perticular emphasis on clas-sifying to describe some representive imperfection testing methods,principles and perculiari-ties reprective in the world,in order to help anyone who use, research and formulate stan-dards. In the end of this article,the authors raise some simple views on imperfection tesingand standard formulating.
出处
《光学仪器》
1996年第4期32-39,共8页
Optical Instruments
关键词
表面疵病
光学仪器
光学元件
Surface Imperfection, Scratch, Dig, Line -equivalent Width (LEW )
