期刊文献+

PbSe(001)表面特性的第一性原理研究 被引量:2

The geometric and electronic properties of the PbSe(001) surface
在线阅读 下载PDF
导出
摘要 用第一性原理的密度泛函理论计算了PbSe(001)表面的几何结构和电子特性。计算结果表明:PbSe(001)表面几层原子出现明显的振荡弛豫现象,但没发生重构,第一、二原子间距减小,第二、三层原子间距增大,同时也发现表面层原子出现褶皱。该表面的直接带隙出现在X点,在导带底和价带顶附近出现4个表面共振态,另外两个表面态分别出现在-4.0eV附近和-11.5eV附近。 The geometry and electronic properties of PbSe(001) surface was invesugated by using the density functioned theory method of first-principles. The calculated results show that the (001) surface of the semiconductor do not reconstruct but exhibit oscillatory geometric relaxation to some extent. The to-second layer distance contracts by 5.62% and the second -to-third layer distance expands by near 3.88% ,in addition,the surface shows a obvious regularity rumpling. The calculations also show the direct surface band gap of the PbSe (001) surface broadens at the X point. Some p characters and s characters surface resonance states appear mainly near the top of the valence band and the bottom of the conduction band.
出处 《功能材料》 EI CAS CSCD 北大核心 2005年第9期1350-1353,共4页 Journal of Functional Materials
基金 河南省自然科学基金资助项目(0311010700)
关键词 密度泛函理论 表面几何结构 表面电子特性 PBSE density functional calculations geometric structure of surface electronic structure of surface PbSe
  • 相关文献

参考文献1

二级参考文献22

  • 1[1]Dashevsky Z,Shusterman S,Dariel M P et al 2002 J.Appl.Phys.92 1425
  • 2[2]Xu G Y,Ge C C,Gao Y P et al 2001 J.Univ.Sci.& Tech.Beijing 8 267
  • 3[3]Orozco R A,Sotelo-Lerma M,Ramirez-Bon R et al 1999 Thin Solid Films 343-344 587
  • 4[4]Pop I,Nascu C,Ionescu V et al 1997 Thin Solid Films 307 240
  • 5[5]Zogg H,Fach A,John J et al 1994 Opt.Eng.33 1440
  • 6[6]Chatterjee S,Pal U 1993 Opt.Eng.32 2923
  • 7[7]Shchukin V A,Bimberg D 1999 Rev.Mod.Phys.71 1125
  • 8[8]Leon R et al 1999 Appl.Phys.Lett.74 2301
  • 9[9]Shiryaev S et al 1997 Phys.Rev.Lett.78 503
  • 10[10]Martinez G,Schluter M,Cohen M L 1975 Phys.Rev.B 11 651

共引文献7

同被引文献15

  • 1刘艳,董云杉,戴嘉维,李戈扬.反应溅射Nb-Si-N薄膜的微结构与力学性能[J].上海交通大学学报,2006,40(10):1763-1766. 被引量:4
  • 2赵跃智,陈长乐,金克新,高国棉.半导体PbSe薄膜的研究进展[J].材料导报,2005,19(7):20-23. 被引量:10
  • 3刘艳,董云杉,黄家桢,张利中,李戈扬.反应溅射Zr-Si-N复合膜的微结构与力学性能[J].真空科学与技术学报,2006,26(3):200-203. 被引量:3
  • 4赵超,杨号.红外复合制导技术概述[J].制导与引信,2007,28(2):1-7. 被引量:8
  • 5T.K.Chu, A.C.Bouley, G. M.Black. Preparation of epitaxial thin film lead salt infrared detectors[C]//Infrared Detector Materials, SPIE Proceedings, 1981, 285: 33.
  • 6E.L. DERENIAK, G. D. BOREMAN. Infrared Detectors and Systems[M]. 1996:382-383.
  • 7R.A. Orozco-Teran, M. Sotelo-Lerma, R. Ramirez-Bon, et al. Pbs-Cds bilayers prepared by the chemical bath deposition technique at different reaction temperatures [J]. Thin Solid Films, 1999, 343: 587-590.
  • 8Ileana Pop, Cristina Nascu, Violeta Ionescu, et al. Structural and optical properties of PbS thin films obtained by chemical deposition[J]. Thin Solid Films, 1997, 307: 240-244.
  • 9Hans. Zogg, Karim Alchalabi, Dmitri Zimin, et al. Lead chalcogenide on silicon infrared sensorsifocal plane array with 96x128 pixels on active si chip[J].Infrared & Technology, 2002, 43:251-255.
  • 10A.Munoz,J.Melendez. M.C. Torquemada et al. PbSe photodetector arrays for IR sensors[J]. Thin solid Films, 1998, 317: 425-428.

引证文献2

二级引证文献7

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部