摘要
阐述了利用离子束分析技术分析高温超导氧化物陶瓷Ｙ－Ｂａ－Ｃｕ－Ｏ中各成分含量的一般原理．运用α粒子在３．０４５ＭｅＶ附近和Ｏ的弹性共振背散射以及卢瑟福背散射，得到了Ｙ－Ｂａ－Ｃｕ－Ｏ各成分的含量，并与质子Ｘ射线荧光分析的结果作了比较，提出了一种简单的背散射处理方法．该方法具有简单、快速、槽度高等优点．
In this paper,the general principles of ion-beam analysis technique are de-scribed in analyzing element-contents of high-temperature superconductivity oxidised ceramic Y-Ba-Cu-O.We have obtained element-contents of Y-Ba-Cu-O by using the 3.045MeV He-4 elastic backscattering resonance(EBSR),Rutherford backscattering(RBS)and proton in--duced X-ray emission (PIX).A simple method are proposed,which deals with RBS and EBSR spectra. It is proved to be completely available.
关键词
背散射
核反应
卢瑟福背散射
PIXE
EBSR RBS PIXE eqivalent thin target reaction section stopping power
