摘要
Ｘ射线粉末衍射全谱图拟合的Ｒｉｅｔｖｅｌｄ方法是一种有效的晶体结构和微结构的分析方法。本文介绍了Ｘ射线粉末衍射全谱图拟合的Ｒｉｅｔｖｅｌｄ方法的基本原理，综述了该方法中的线形分析、校正及其在晶体结构分析、微结构分析、相定量分析和衍射图谱指标化等方面应用的最新进展。
The Rietveld method is an efficient method in determination of crystal structure and micro structure.Foundamental theory of the Rietveld method was introduced.The functions used in profile analysis and the correction models of preferred orientation,microabsorption and background were summarized in detail.The latest applications of the Rietveld method in crystal structure (including modulated structure) ,microstructure,quantitative phase abundance determination and pattern indexing were reviewed.In the last of the article,new progress in data collection strategies was given.
出处
《物理学进展》
CSCD
北大核心
1996年第2期228-250,共23页
Progress In Physics
