摘要
通过光学显微镜（OM），扫描电镜（SEM）和扫描隧道显微镜（STM）观察了光记录有机薄膜的微区结构。从微区结构的形貌可以看出光记录后酞菁薄膜上产生了鼓泡。通过这些观察方法的比较发现扫描隧道显微镜可以提供更加详细、精确的三维参数。薄膜的微区结构研究对于分析光盘的性能、了解记录机理具有重要意义。
In this paper, optical microscopy (OM), scanning electron microscopy (SEM)and scanning tunneling microscopy (STM) are used to investigate the microstructure of recorded organic thin film. Bubbles are found for organic thin film after laser irradiation. Among these methods, STM can provide more detailed and accurate three dimensional parameters of the microstructure. The microstructural study plays an important role in analyzing disc performance and recording mechanism.
出处
《光学学报》
EI
CAS
CSCD
北大核心
1996年第4期542-546,共5页
Acta Optica Sinica
关键词
有机薄膜
光记录
光盘
organic thin film, optical recording, morphology
