摘要
介绍了红外背景杂波的基本概念及机器视觉系统中的两类红外背景杂波量化方式:基于背景功率谱密度(PSD)分布模型和基于小波变换。分析了各自的优缺点及适用范围,展望了红外杂波量化技术的未来发展前景。
The basic principle and quantitative characterization approaches of infrared background clutter are presented in this paper. The focus is put on the two classical metrics used in machine vision systems： background power spectral density （PSD） distribution model and wavelet. The advantage, disadvantage and applicability are analyzed respectively. At the end, development prospect is interviewed.
出处
《红外技术》
CSCD
北大核心
2005年第5期403-407,共5页
Infrared Technology
基金
国家自然科学基金(批准号60277005)资助项目
