摘要
本文通过对CPU工作原理的考察和对发展趋势的分析,得出CPU发生失效的几率越来越高,而且原因也越来越多,同时也指出老化筛选试验技术仍然是CPU质量和可靠性保障的重要手段。面对CPU飞速发展所带来的新问题,老化技术面临着许多有待解决的新的技术挑战,强调了制定可操作的CPU老化试验技术规范的紧迫性。
By studying theory and analyzing development trend of CPU, this paper shows that the failure rate of CPU becomes high and the failure causes becomes more and more. Bum - in screen out test technique is also the important approach to ensure CPU quality and reliability. The development of CPU is rapidly, burn - in technique of CPU faces a lot of challenges which will be solved. It＇s very urgent to make a practical burn - in test technology standard of CPU.
出处
《微处理机》
2005年第4期3-6,共4页
Microprocessors
